課程名稱 |
X光繞射學 X-ray Diffraction |
開課學期 |
103-2 |
授課對象 |
工學院 材料科學與工程學研究所 |
授課教師 |
溫政彥 |
課號 |
MSE7007 |
課程識別碼 |
527 M1030 |
班次 |
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學分 |
3 |
全/半年 |
半年 |
必/選修 |
選修 |
上課時間 |
星期二2,3,4(9:10~12:10) |
上課地點 |
工綜213 |
備註 |
總人數上限:40人 |
Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1032MSE7007_X |
課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
課程大綱
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課程概述 |
(1) Properties of X-Ray
(2) Crystallography and Reciprocal Lattice
(3) Principles of X-Ray Diffraction
(4) Experimental Methods
a.Laue Photographs
b.Powder Photographs
c.Diffractometer and Spectrometer Measurements
(5) Orientation and Quality of Single Crystal
(6) Structure of Polycrystalline Aggregates
(7) Determine of Crystal Structure and Precise Parameter Measurements
(8) Chemical Analysis by X-Ray Diffraction
(9) Chemical Analysis by X-Ray Spectrometry
(10) Other Applications |
課程目標 |
(1) Properties of X-Ray
(2) Crystallography and Reciprocal Lattice
(3) Principles of X-Ray Diffraction
(4) Experimental Methods
a.Laue Photographs
b.Powder Photographs
c.Diffractometer and Spectrometer Measurements
(5) Orientation and Quality of Single Crystal
(6) Structure of Polycrystalline Aggregates
(7) Determine of Crystal Structure and Precise Parameter Measurements
(8) Chemical Analysis by X-Ray Diffraction
(9) Chemical Analysis by X-Ray Spectrometry
(10) Other Applications
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課程要求 |
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預期每週課後學習時數 |
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Office Hours |
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指定閱讀 |
待補 |
參考書目 |
B. E. Warren, X-ray Diffraction, Dover, 1992.
A. Guinier, X-ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies, Dover, 1994.
C. Barrett and T. B. Massalski, Structure of Metals, Pergamon, 1982.
D. S. Siva, Elementary Scattering Theory, Oxford, 2011.
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評量方式 (僅供參考) |
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週次 |
日期 |
單元主題 |
第1週 |
2/24 |
Introduction |
第2週 |
3/03 |
Fundamentals of crystal structure |
第3週 |
3/10 |
The reciprocal lattice |
第4週 |
3/17 |
The Fourier transform |
第5週 |
3/24 |
The convolution theorem |
第6週 |
3/31 |
Wave equation and the superposition principle |
第7週 |
4/07 |
(No class) |
第8週 |
4/14 |
The Laue equations and the Ewald construction |
第9週 |
4/21 |
Diffraction methods (I) |
第10週 |
4/28 |
Diffraction methods (II) |
第11週 |
5/05 |
Structure factor |
第12週 |
5/12 |
Interference function |
第13週 |
5/19 |
Midterm exam |
第14週 |
5/26 |
The Scherrer equation |
第15週 |
6/02 |
Integrated intensity, absorption, temperature effect |
第16週 |
6/09 |
Diffraction intensity of disordered phase and order-disorder transformation |
第17週 |
6/16 |
Long-period anti-phase domain structure, powder diffraction file, qualitative analysis, grazing incidence XRD |
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